Phenom Pro G6 Desktop SEM
Desktop SEM for robust and effortless SEM analysis, expanding your research capability.
The Thermo Scientific Phenom Pro G6 Desktop SEM is a versatile and reliable tool designed to enhance research capabilities. Featuring a long-lasting, high-brightness CeB6 electron source, it bridges the gap between light microscopy and floor-model SEM analysis, boosting facility productivity. Equipped with custom detection hardware and an advanced color navigation camera, it delivers high-quality imaging.
This user-friendly SEM is ideal for relieving routine analysis burdens from floor-model units, offering quick training and easy operation for users of all experience levels. Built on the sixth-generation platform, it supports automated accessories like Phenom ProSuite Software and active sample holders. The Phenom Pro G6 can be upgraded to the ProX model with EDS or equipped with Phenom ProSuite Software, and an optional secondary electron detector is available. It also allows for live mixing of backscattered and secondary electrons.
Compared to previous models, the G6 offers 20% improved resolution and an enhanced user experience, enabling analysis of a wider range of samples, including those sensitive to electron beams.
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Features
Effortless
The integrated color navigation camera in the Phenom Pro Desktop SEM allows users to easily bridge the gap between optical and electron microscopy, and only 10 minutes of basic training are needed before capturing images. A broad selection of sample holders supports various applications, and our patented sample vacuum loading technology makes sample loading both fast and straightforward.
Phenom ProSuite Software
The Thermo Scientific Phenom ProSuite Software, available as an optional application platform, significantly expands the functionality of the Phenom desktop SEM, enabling users to extract the most comprehensive data from their acquired images.
Secondary electron detector
An optional secondary electron detector (SED) is available for the Phenom Pro Desktop SEM, providing detailed surface information by capturing low-energy electrons from the sample's top layer.
Specification
| Light optical magnification |
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| Electron optical magnification range |
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| Resolution |
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| Digital zoom |
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| Light optical navigation camera |
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| Acceleration voltages |
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| Vacuum levels |
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| Detector |
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| Sample size |
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| Sample height |
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