Precision LC II Ferroelectric Tester

The Precision LCII is Radiant's answer to a growing need for affordable characterization equipment. The Precision LCII is an ideal general-purpose tester with a broad test range for thin films and bulk ceramics. The Precision LCII tester has a frequency rating of 5KHz at +/-200V built-in to the system. Using up to 32,000 points with18-bit resolution from 2kHz out to 1/30th of a Hertz for capacitors ranging from square microns to square centimeters, the LC II enables high resolution characterization for bulk capacitors. The Precision LCII II is offered with a variety of internal amplifiers. The Precision LCII is offered in a ±10V, 30V, 100V, 200V, and 500V built-in drive volt option. The Precision LCII can be expanded to 10kV with the addition of a high voltage interface and amplifier.

Tester Parameter LC II
Voltage Range (built-in drive voltage) ±10V, ±30V, ±100V, ±200V or ±500V built-in
Voltage Range with an external amplifier and high voltage interface (HVI) 10KV
Number of ADC Bits 18
Minimum Charge Resolution <10fC< /td>
Minimum Area Resolution (assuming 1 ADC bit = 1μC/cm2) <1μ2< /td>
Maximum Charge Resolution 276μC
Maximum Area Resolution (assuming saturation polarization = 100μC/cm2) 2.76cm2
Maximum Charge Resolution with High Voltage Interface (HVI) 27.6mC
Maximum Area Resolution (assuming saturation polarization = 100μC/cm2) w/o HVI >100cm2
Maximum Hysteresis Frequency 5KHz @ 10V
5KHz @ 30V
5KHz @ 100V
5KHz @ 200V
2KHz @ 500V
Minimum Hysteresis Frequency 0.03Hz
Minimum Pulse Width 50μs
Minimum Pulse Rise Time (5V) 40μs
Maximum Pulse Width 1s
Maximum Delay between Pulses 40ks
Internal Clock 25ns
Minimum Leakage Current (assuming max current integration period = 1 seconds) 1pA
Maximum Small Signal Cap Frequency 20KHz
Minimum Small Signal Cap Frequency 1Hz
Output Rise Time Control 103 scaling
Input Capacitance -6fF
Electrometer Input All Test Frequencies for all test at any speed Yes
* The minimum area resolution under actual test conditions depends upon the internal noise environment of the tester, the external noise environment, and the test jig parasitic capacitance.
*** Tester specifications are subject to change without notice.



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