Precision Premier II Ferroelectric Tester
The Precision Multiferroic II Ferroelectric Tester is the most advanced test system on the market. The Multiferroic II has a unique frequency rating of 270KHz at +/-100V built-in to the system. The Multiferroic II tester makes testing of thin films and bulk ceramics a fast and simple process. It captures 32,000 points at 2 MHz to achieve exquisite frequency resolution in DLTS or PAINT measurements.
The Precision Multiferroic II is offered with a variety of internal amplifiers. The Multiferroic II is offered with a ±100V, 200V and 500V built-in drive volt option. The Multiferroic II can be expanded to 10kV with the addition of a high voltage interface and an amplifier.
Tester Parameter | Premier |
Voltage Range (built-in drive voltage) | ±10V, ±30V, ±100V, ±200V or ±500V built-in |
Voltage Range with an external amplifier and high voltage interface (HVI) | 10KV |
Number of ADC Bits | 18 |
Minimum Charge Resolution | 0.80fC |
Minimum Area Resolution (assuming 1 ADC bit = 1μC/cm2) | 0.080μ2 |
Maximum Charge Resolution | 5.26mC |
Maximum Area Resolution (assuming saturation polarization = 100μC/cm2) | 52.6cm2 |
Maximum Charge Resolution with High Voltage Interface (HVI) | 526mC |
Maximum Area Resolution (assuming saturation polarization = 100μC/cm2) w/o HVI | >100cm2 |
Maximum Hysteresis Frequency | 250KHz @ 10V 50KHz @ 30V 50KHz @ 100V 50KHz @ 200V 2KHz @ 500V |
Minimum Hysteresis Frequency | 0.03Hz |
Minimum Pulse Width | 0.5μs |
Minimum Pulse Rise Time (5V) | 400ns |
Maximum Pulse Width | 1s |
Maximum Delay between Pulses | 40ks |
Internal Clock | 25ns |
Minimum Leakage Current (assuming max current integration period = 1 seconds) | 1pA |
Maximum Small Signal Cap Frequency | 1MHz |
Minimum Small Signal Cap Frequency | 1Hz |
Output Rise Time Control | 105 scaling |
Input Capacitance | -6fF |
Electrometer Input All Test Frequencies for all test at any speed | Yes |
* The minimum area resolution under actual test conditions depends upon the internal noise environment of the tester, the external noise environment, and the test jig parasitic capacitance. | |
*** Tester specifications are subject to change without notice. |