SPA 25
The Surface Profile Analyzer SPA 25 utilises white-light interferometry for studying the surface topography and roughness parameters with exceptional speed and enable the system to achieve a height resolution of down to 0.1 nm even with small magnification factors. When it is used in combination with an optical contact angle measuring system of the DataPhysics OCA series, such integration provides further insight into surface properties by e.g. determining the surface corrected contact angle according to the Wenzel theory.
The SPA 25 instrument comes with the industry leading MountainsMap® Imaging Topography software providing a comprehensive set of tools for the analysis of the studied surface. The software allows instrument to create 3D maps of large surface areas (up to 300 mm x 300 mm with automated sample table) and to detect defects caused by material processing and treatment. The surface roughness can be analysed according to various industry standards like ISO 25178, ISO 4287, ISO 13565, ISO 16610, etc.
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- white-light interferometry measurement technique with z-direction resolution being independent of the magnification factor of the used objective.
- precision piezoelectric scan drive in combination with gauge control
- up to 400 μm scan range in z-direction and with a scan speed of 11.3 μm/s at full resolution
- USB 3 high speed camera up to 3000 frames/s
- two scan modes:
- EPSI (extended phase shift interferometry) with 0.1 nm height resolution
- VSI (vertical scanning interferometry) with 1 nm height resolution
- Mirau interferometer microscope objectives with different magnification factors
- Either use of automatic or manual sample table
