NanoTR/PicoTR
The Most Established Method for the Determination of Thermal Diffusivity
In modern industries, the knowledge of thermal properties, specifically thermophysical properties, becomes more and more important. They are required, for example, for the development of heat release materials of advanced and miniaturized electronics, thermoelectric materials as sustainable energy, insulating materials for saving energy, TBCs (thermal barrier coatings) for turbine blades, and safety operation of nuclear plants, etc.
Among the thermophysical properties, the thermal conductivity is of paramount importance. The determination of the thermal diffusivity/thermal conductivity can be realized with the established laser flash method (LFA). This method has been known for many years to provide reliable and accurate results. Sample thicknesses typically range from 50 μm to 10 mm.
NETZSCH is a world-wide leading manufacturer of instruments for testing thermophysical properties, specifically of laser flash analyzers. These LFA systems are used in the fields of ceramics, metals, polymers, nuclear research, etc.
| NanoTR | PicoTR | ||
| Pump Laser |
Pulse width Wave length Beam diameter |
1 ns 1550 nm 100 μm |
0.5 ps 1550 nm 45 μm |
| Probe Laser |
Pulse width Wave length Beam diameter |
contiuous 785 nm 50 μm |
0.5 ps 775 nm 25 μm |
| Measurement items | Thermal diffusivity and effusivity, interfacial resistance | ||
|
Sample Film Thickness (RF method) |
Resin Ceramics Metal |
30 nm ... 2 μm 300 nm ... 5 μm 1 μm ... 20 μm |
10 nm ... 100 nm 10 nm ... 300 nm 100 nm ... 900 nm |
|
Sample Film Thickness (FF method) |
Thicker than 1 μm | Thicker than 100 nm | |
| Substrate |
Material Size Thickness |
Opaque/Transparent 10 ... 20 mm square 1 mm max. |
|
| Thermal diffusivity | Range | 0.01 ... 1000 mm²/s | |
| Accuracy |
± 6.2% with 40 min measurement time, for CRM 5808A in RF Mode, 400 nm thickness |
||
| Repeatability | ± 5% | ||
| Software | Calculation of thermal properties, multilayer analysis, database | ||
