NanoTR/PicoTR

The Most Established Method for the Determination of Thermal Diffusivity

In modern industries, the knowledge of thermal properties, specifically thermophysical properties, becomes more and more important. They are required, for example, for the development of heat release materials of advanced and miniaturized electronics, thermoelectric materials as sustainable energy, insulating materials for saving energy, TBCs (thermal barrier coatings) for turbine blades, and safety operation of nuclear plants, etc.

Among the thermophysical properties, the thermal conductivity is of paramount importance. The determination of the thermal diffusivity/thermal conductivity can be realized with the established laser flash method (LFA). This method has been known for many years to provide reliable and accurate results. Sample thicknesses typically range from 50 μm to 10 mm.

NETZSCH is a world-wide leading manufacturer of instruments for testing thermophysical properties, specifically of laser flash analyzers. These LFA systems are used in the fields of ceramics, metals, polymers, nuclear research, etc.

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   NanoTR PicoTR
Pump Laser

Pulse width

Wave length

Beam

diameter

1 ns 

1550 nm

100 μm

0.5 ps

1550 nm

45 μm

Probe Laser

Pulse width

Wave length

Beam

diameter

contiuous

785 nm

50 μm

0.5 ps

775 nm

25 μm

Measurement items   Thermal diffusivity and effusivity, interfacial resistance

Sample Film Thickness

(RF method)

Resin

Ceramics

Metal

30 nm ... 2 μm

300 nm ... 5 μm

1 μm ... 20 μm

10 nm ... 100 nm

10 nm ... 300 nm

100 nm ... 900 nm

Sample Film Thickness

(FF method)

  Thicker than 1 μm Thicker than 100 nm
Substrate

Material

Size

Thickness

Opaque/Transparent

10 ... 20 mm square

1 mm max.

Thermal diffusivity Range 0.01 ... 1000 mm²/s
  Accuracy

± 6.2% with 40 min measurement time,

for CRM 5808A in RF Mode, 400 nm thickness

  Repeatability ± 5%
Software   Calculation of thermal properties, multilayer analysis, database

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