Desktop Scanning Electron Microscope (SEM)
The Phenom Desktop SEM product line offers versatile and reliable topographic and elemental analysis (via integrated EDS) with an intuitive interface, enabling even novice users to quickly obtain high-quality results. This makes it ideal for materials science, where researchers from various backgrounds need vital analytical information. Desktop SEMs enhance ease of use, democratizing the technology, and their reduced size eliminates the need for specialized facilities. Their robustness even allows for mobile, on-site analysis.
Desktop SEM Solutions
Phenom Pharos G2 Desktop FEG-SEM
This high-performance desktop SEM offers integrated EDS for elemental analysis. It delivers <6nm (SE) and <8nm (BSE) resolution and magnifies up to 350,000x. An optional SE detector is also available.
Phenom XL G2 Desktop SEM
Designed for large samples (100x100 mm) and automated workflow, this system offers <10 nm resolution, up to 200,000 magnification, and a 4.8-20 kV acceleration voltage. Optional intergrated EDS and BSE detectors are available.
Phenom ProX G6 Desktop SEM
This high-performance desktop SEM offers integrated EDS for elemental analysis, achieving <6nm (SE) and <8nm (BSE) resolution and up to 350,000x magnification. An optional SE detector is available.
Phenom Pro G6 Desktop SEM
This high-performance desktop SEM offers <6nm (SE) and <8nm (BSE) resolution, up to 350,000x magnification, and an optional SE detector.
Phenom Pure G6 Desktop SEM
Entry-level desktop SEM with <15nm resolution, up to 175,000x magnification, and a long-life CeB6 source.
Phenom ParticleX Desktop SEM
ParticleX automates SEM-EDS for unbiased quality control in steel, AM, GSR, TC, and battery industries, ensuring standards compliance.
