Focused ion beam scanning electron microscopy (FIB-SEM)
Thermo Fisher Scientific is the industry leader in FIB-SEM technology with more than 30 years of experience with DualBeams. The technology's novel ability to reveal subsurface structural detail, by making precise cuts with a FIB and then imaging the exposed surface with a high-resolution SEM, has led to its acceptance by researchers and engineers in a wide variety of applications. With more than 2,000 Thermo Scientific systems installed around the world, our DualBeams continue to lead the market with cutting-edge capabilities built on technical innovation and a deep store of application knowledge gathered over years of collaborative development with our customers.
DualBeam instruments
Aquilos 2 Cryo-FIB
Aquilos 2 Cryo-FIB is dedicated to the preparation of thin, electron-transparent lamellas for high-resolution cellular cryo-electron tomography or MicroED of micro-crystals
Scios 3 FIB-SEM
Scios 3 FIB-SEM is an advanced, ultra-high-resolution analytical-focused ion beam scanning electron microscope (FIB-SEM). It excels in delivering exceptional sample preparation and 3D characterization for a wide range of samples, including magnetic and non-conductive materials.
