Scios 3 FIB-SEM
Versatile FIB-SEM for high throughput performance with advanced automation
Scios 3 FIB-SEM is an innovative solution designed to enhance your research capabilities with its ultra-high resolution imaging, automated cross-section analysis, and exceptional sample preparation for TEM and STEM. This versatile instrument leverages innovative technology and user friendly interface, making it ideal for a wide range of applications. Explore how the Scios 3 FIB-SEM can streamline your workflows, reduce user intervention, and support consistent, high-quality results in high-throughput environments.
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Features
Ultra-high-resolution SEM imaging with NICol electron column
The innovative NICol electron column provides the foundation of the Scios 3 FIB-SEM's high-resolution imaging and detection capabilities. It offers excellent nanoscale details, using a wide range of working conditions, whether operating at 30 keV in STEM mode to access structural information or at lower energies to obtain charge-free, detailed information from the surface. Fast, accurate, and reproducible results are obtained thanks to unique NICol column design with full auto alignments.
Automated cross-section analysis
The Scios 3 FIB-SEM introduces a dedicated application for fully automated cross-section analysis, enabling high-quality, multi-modal subsurface characterization with precise targeting of the region of interest. This solution is designed to streamline workflows, reduce user intervention, and help ensure consistent, high-quality results in high-throughput environments.
SEM imaging provides complete sample information
Exceptional in-lens Trinity Detection Technology is designed for simultaneous acquisition of angular and energy-selective SE and BSE imaging. Fast access to extremely detailed nanoscale information is provided, not only top-down, but also on tilted specimens or cross sections. Optional below-the-lens detectors and electron beam- deceleration mode help ensure fast and easy simultaneous collection of all signals to reveal the smallest features in material surfaces or cross-sections.
High-quality sample preparation for STEM and TEM
The latest technological innovations of the Scios 3 FIB-SEM, in combination with the comprehensive, intuitive Thermo Scientific AutoTEM 5 Software and our application expertise, allow for fast and easy preparation of site- specific HR-S/TEM samples for a wide range of materials. To achieve high-quality results, final polishing with low-energy ions is required to minimize surface damage on the sample. Thermo Scientific DualBeam Technology not only delivers high-resolution imaging and milling at high voltages, but also has excellent low-voltage performance, helping you create high-quality TEM lamella.
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