Phenom XL G2 Desktop SEM

Desktop SEM with increased chamber size for large samples up to 100 mm x 100 mm.

The Thermo Scientific Phenom XL G2 Desktop SEM streamlines quality control, delivering accurate and consistent results while maximizing productivity. Its intuitive interface ensures rapid user proficiency, making it suitable for diverse applications. Featuring full-screen images and a rapid 40-second image acquisition time - three times faster than competitors - the system efficiently analyzes large samples (up to 100 x 100 mm) with 10nm resolution, revealing intricate details. A proprietary vent/load mechanism ensures high throughput through fast sample exchange.

 

Building on the proven user-friendliness of Thermo Scientific Desktop SEMs, the interactive databar and overlay structure simplify operation, enabling both experienced and novice users to quickly become comfortable with the system. The standard four-segment backscattered electron detector (BSD) provides sharp images and chemical contrast.

 

Optional fully integrated energy-dispersive spectroscopy (EDS) and secondary electron detectors (SED) can be added for elemental analysis and surface-sensitive imaging, respectively. The ProSuite application platform, including applications like ParticleMetric, PoroMetric, FiberMetric, and 3D Roughness Reconstruction, further enhances sample analysis capabilities.

For further information, Please visit:

Thermo Fisher Desktop SEM, Thermo Fisher logo
Phenom XL G2 Desktop SEM with large sample holder up to 100mm x 100mm, Optional fully integrated energy-dispersive spectroscopy (EDS), Thailand distribution by LMS instruments

Features

Automation

The Phenom XL G2 Desktop SEM offers automated workflows via its Phenom Programming Interface (PPI), which allows Python scripting control. This enables users to automate repetitive tasks like particle, pore, fiber, and large image analysis, streamlining their SEM workflow.

Long-lifetime CeB₆ source

Utilizing a CeB₆ source provides enhanced image quality through increased brightness, surpassing tungsten sources, and ensures long-term reliability with its extended lifetime and predictable maintenance.

Eucentric sample holder

The optional eucentric sample holder, which enables eucentric tilt and rotation, is essential for many SEM applications, significantly improving the speed and accuracy of sample analysis.

Element identification (EID)

The Phenom XL G2 Desktop SEM can be equipped with an optional energy-dispersive X-ray spectroscopy (EDS) detector to obtain more material insights with element identification via X-ray analysis.

Step-by-step data collection

The Elemental Identification (EID) software package provides dedicated control for the fully integrated EDS detector. Its user-friendly, step-by-step workflow ensures that users collect X-ray data in a well-organized and structured manner.

Specification

Electron optical
  • Long lifetime thermionic source (CeB₆ )
  • Multiple beam currents
Electron optical magnification range
  • 160 - 200,000x
Light optical magnification
  • 3 - 16x
Resolution
  • <10 nm
Image resolution options
  • 960 x 600, 1920 x 1200, 3840 x 2400 and 7680 x 4800 pixels
Acceleration voltages
  • Default: 5 kV, 10 kV and 15 kV
  • Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode
Vacuum levels
  • Low - medium - high
Detector
  • Backscattered electron detector (standard)
  • Secondary electron detector (optional)
  • Energy-dispersive X-ray spectroscopy (EDS) detector (optional)
Sample size
  • Max. 100 mm x 100 mm (up to 36 x 12 mm pin stubs)
  • Max. 40 mm (h)
Sample loading time
  • Light optical <5 s
  • Electron optical <60 s

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