Phenom Pharos G2 Desktop FEG-SEM

Achieve high-quality imaging across disciplines with this tabletop field emission gun SEM.

The Thermo Scientific Phenom Pharos G2 Desktop FEG-SEM brings high-resolution field emission SEM to your benchtop, surpassing many floor models in image quality and user experience. It makes FEG performance accessible to labs previously limited by traditional FEG-SEM complexities.

This desktop FEG-SEM enables rapid sample loading and imaging, delivering detailed results within 30 seconds, and features an intuitive interface for easy operation by users of all experience levels. It offers 2.0 nm resolution at 20kV and supports low voltages for sensitive samples.

Unlike traditional FEG-SEMs, which are large, complex, and require specialized facilities, the Pharos G2 is easy to install and maintain, needing only a table and standard outlet. It includes necessary peripherals and automated initialization, making high-quality nanomaterial characterization readily available.

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Phenom Pharos G2 Desktop FEG-SEM surpassing many floor models in image quality and user experience, Thailand distribution by LMS instruments

Features

Unique field emission source

Unique among desktop SEMs, the Phenom Pharos G2 FEG-SEM offers a field emission source, which guarantees high brightness, crisp images, and stable beam current.

Gentle imaging

With a voltage range down to 1 kV, the Phenom Pharos G2 FEG-SEM enables imaging of beam-sensitive samples, such as polymers, as well as insulating samples, without the requirement to apply a coating. As a result, nanoscale surface features are not obscured.

A world of information

On the Phenom Pharos G2 FEG-SEM, morphological information is acquired together with compositional information, thanks to SE, BSE, and EDS detectors built into the system. A range of sample holders is available for temperature-controlled or electrical experiments.

Excellent resolving power

The Phenom Pharos G2 FEG-SEM offers a resolution of 2.0 nm at 20 kV. Such performance shows the shape of nanoparticles, imperfections in coatings, or other features that would be missed by tungsten SEMs or other tabletop SEMs.

Higher productivity

While FEG SEMs have a reputation for being difficult to accommodate and difficult to operate, the Phenom Pharos G2 FEG-SEM literally requires only a desk, and less than one hour of training. Master students, visitors, or other researchers typically not trained to work on high-end FEG SEMs can easily use the Phenom Pharos G2 FEG-SEM to create eye-catching images.

Specification

Resolution
  • 2.0 nm (SE), 3 nm (BSE) at 20 kV
  • 10 nm (SE) at 3 kV
Electron optical magnification range
  • Up to 2,000,000x
Light optical magnification
  • 27 - 160x
Acceleration voltages
  • Default: 5 kV, 10 kV and 15 kV
  • Advanced mode: adjustable range between 1 kV and 20 kV
Vacuum modes
  • High vacuum mode
  • Medium vacuum mode
  • Integrated charge reduction mode (low vacuum mode)
Detector
  • Back scattered electron detector (standard)
  • Energy-dispersive X-ray spectroscopy (EDS) detetor (optional)
  • Secondary electron detector (optional)
Sample size
  • Up to 25 mm diameter (32 mm optional)
Sample height
  • Up to 35 mm (100 mm optional)

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