Component cleanliness analysis with a multi-purpose desktop SEM

The Thermo Scientific Phenom ParticleX TC Desktop SEM is a versatile tool for microscale technical cleanliness and materials characterization. It enables rapid, accurate, and trusted in-house analysis, including characterization, verification, and classification, supporting efficient production. Its user-friendly design makes advanced particle and material analysis accessible to a broader range of users.

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For particle analysis beyond light microscopy, especially in automotive, the Phenom ParticleX TC Desktop SEM provides automated SEM/EDS. This enables chemical classification, giving insights into production and environment. Standard VDA 19/ISO 16232 or ISO 4406/4407 reports are available.

The user interface, leveraging the proven usability of Phenom desktop SEMs, facilitates rapid adoption, requiring minimal training for both experienced and new users.

An optional secondary electron detector (SED) on the Phenom ParticleX TC (Technical Cleanliness) Desktop SEM provides detailed surface information by collecting low-energy electrons, useful for topography and morphology analysis, especially for microstructures, fibers, and particles.

The Phenom ParticleX TC Desktop SEM simplifies elemental analysis with its intuitive 'click and go' interface for elemental mapping and line scans. The line scan feature provides a clear, quantified visual representation of element distribution along a line.

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