Desktop SEM for additive manufacturing analysis, capable of observing large samples up to 100 mm x 100 mm.

The Thermo Scientific Phenom ParticleX Desktop Scanning Electron Microscope (SEM) is a versatile SEM specifically designed for additive manufacturing, providing high purity at the microscale. Its chamber accommodates samples as large as 100 mm x 100 mm. The innovative venting and loading mechanism ensures the quickest vent/load cycle in the industry, maximizing throughput. With the Phenom ParticleX AM Desktop SEM, you gain full control of your data in-house: Monitor essential characteristics of metal powders Optimize powder-bed and powder-fed additive manufacturing processes Identify particle size distributions, individual particle morphology, and foreign particles.

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For particle analysis beyond light microscopy, especially in automotive, the Phenom ParticleX TC Desktop SEM provides automated SEM/EDS. This enables chemical classification, giving insights into production and environment. Standard VDA 19/ISO 16232 or ISO 4406/4407 reports are available.

The user interface, leveraging the proven usability of Phenom desktop SEMs, facilitates rapid adoption, requiring minimal training for both experienced and new users.

An optional secondary electron detector (SED) on the Phenom ParticleX TC (Technical Cleanliness) Desktop SEM provides detailed surface information by collecting low-energy electrons, useful for topography and morphology analysis, especially for microstructures, fibers, and particles.

The Phenom ParticleX TC Desktop SEM simplifies elemental analysis with its intuitive 'click and go' interface for elemental mapping and line scans. The line scan feature provides a clear, quantified visual representation of element distribution along a line.

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