Desktop scanning electron microscope for battery production and research

In battery development and manufacturing, material purity is paramount. Even trace contaminants in materials like NCM powder can severely impact product performance. The Phenom Desktop SEM, designed specifically for battery materials analysis, provides high-resolution SEM imaging coupled with EDS for chemical identification. When automated, this combination delivers a powerful solution for rigorous powder quality inspection.

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The Phenom ParticleX Steel Desktop SEM uses standard wall power, eliminating the need for infrastructure changes. Its integrated EDS provides 'click-and-go' elemental mapping and line scans for quantified element distribution.

Building on the intuitive interface of the established Phenom Desktop SEMs, this system ensures a minimal learning curve for both experienced and new users. The high-brightness CeB6 source enhances image detail and accelerates automated steel inclusion analysis, maximizing efficiency.

Although the system comes with pre-set classification rules and analysis recipes for immediate steel inclusion analysis, it also provides complete customization options. This flexibility allows users to refine their analysis and uncover new insights through updated recipes.

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